We developed a custom automatic semiconductor tester that tests parameters of several types of devices including BJTs, MOSFETs, IGBTs and Diodes. The tester could test very high voltage and very high current parameters.
We have developed an automated parametric analyzer system that automatically generates many of the graphs in a semiconductor data sheet. A special software configures the instruments needed and routes the signals to the DUT pins and extracts the data and formats it to graphical format
An automotive electronics company wants their devices monitors for circuit micro-interruptions while the device is undergoing vibration tests. The tester can monitor up to 32 lines real time for micro-interrupts. When the micro-interrupts do occur, the waveform is shown onscreen and raw oscilloscope data is stored for post analysis.
Building Automation is a spin-off of our Data Acquisition technology. We implement monitoring and targeting (M&T) techniques to detect and diagnose wasteful or inefficient use of energy, water and other consumables resources. Our software provides a feature-rich solution to the M&T problems. Via special techniques we could monitor and possibly control energy consumption on every critical area in a building or factory facility.
